An Optical Streaking Method for Measuring Femtosecond Electron Bunches

The measurement of the ultra-short electron bunch length on the femtosecond time scale constitutes a very challenging problem. In the x-ray free electron laser facilities such as the Linac Coherent Light Source, generation of a sub-ten femtoseconds electron beam with 20pC charge is possible, but direct measurements are very difficult due to the resolution limit of the present diagnostics. We propose a new method here based on the measurement of the electron beam energy modulation induced from laser-electron interaction in a short wiggler. A typical optical streaking method requires a laser wavelength much longer than the electron bunch length. In this paper a laser with its wavelength shorter than the electron bunch length has been adopted, while the slope on the laser intensity envelope is used to distinguish the different periods. With this technique it is possible to reconstruct the bunch longitudinal profile from a single shot measurement.